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Volumn 65, Issue 2, 1999, Pages 123-126

Mechanical stress reduction in PECVD a-Si:H thin films

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; HYDROGENATION; MATHEMATICAL MODELS; MOLECULAR DYNAMICS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; STRESS ANALYSIS;

EID: 0033570525     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(99)00222-6     Document Type: Article
Times cited : (11)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.