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Volumn 65, Issue 2, 1999, Pages 123-126
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Mechanical stress reduction in PECVD a-Si:H thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON;
HYDROGENATION;
MATHEMATICAL MODELS;
MOLECULAR DYNAMICS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
STRESS ANALYSIS;
ATOMIC CLUSTER INTERACTION;
STRESS REDUCTION;
AMORPHOUS FILMS;
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EID: 0033570525
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(99)00222-6 Document Type: Article |
Times cited : (11)
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References (11)
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