Hydrogen bonding and structural order in hydrogenated amorphous silicon prepared with hydrogen-diluted silane

Journal of Physics D: Applied Physics

Volumn 37, Issue 2, 2004, Pages 249-254

  Danesh, P ^a   Pantchev, B ^a   Antonova, K ^a   Liarokapis, E ^b   Schmidt, B ^c   Grambole, D ^c   Baran, J ^d  

^a INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

^b NATIONAL TECHNICAL UNIVERSITY OF ATHENS   (Greece)

^c INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^d Polish Academy of Sciences   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROGEN BONDS; HYDROGENATION; LIGHT ABSORPTION; PHASE TRANSITIONS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; RAMAN SPECTROSCOPY; SILANES; SPECTROMETERS;

HYDROGENATED AMORPHOUS SILICON; INFRARED ABSORPTION; JOBIN-YVON TRIPLE SPECTROMETER; NUCLEAR REACTION ANALYSIS;

AMORPHOUS SILICON;

EID: 0942288933     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/37/2/013     Document Type: Article

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