Characterizing field emission from individual carbon nanotubes at small distances

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 24, Issue 3, 2006, Pages 1081-1087

  Hii, King Fu ^a   Vallance, R Ryan ^b   Chikkamaranahalli, Sumanth B ^b   Pinar Mengu M ^a   Rao, Apparao M ^c  

^a UNIVERSITY OF KENTUCKY   (United States)

^b The George Washington University   (United States)

^c CLEMSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONVENTIONAL EXTRACTION; CURVE-FITTING ALGORITHM; EMPIRICAL POWER RELATION;

ALGORITHMS; ANODES; CURVE FITTING; ELECTRIC FIELDS; NANOSTRUCTURED MATERIALS; PARAMETER ESTIMATION; SEPARATION; SUBSTRATES; TUNGSTEN;

CARBON NANOTUBES;

EID: 33744832012     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2188403     Document Type: Article

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