Field emission microscopy of carbon nanotube caps

Journal of Applied Physics

Volumn 85, Issue 7, 1999, Pages 3832-3836

  Dean, Kenneth A ^a   Chalamala, Babu R ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CARBON; ELECTRONIC STRUCTURE; FIELD EMISSION MICROSCOPES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

CARBON NANOTUBE CAPS; SINGLE-WALLED NANOTUBES (SWNT);

NANOTUBES;

EID: 0032607532     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369753     Document Type: Article

References (22)

1. B. R. Chalamala, Y. Wei, and B. E. Gnade, IEEE Spectr. 35, 42 (1998).
2. Yu. V. Gulayev, L. A. Chernozatonskii, Z. Ja. Kosakovskaja, N. I. Sinitsyn, G. V. Torgashov, and Yu. F. Zakharchenko, J. Vac. Sci. Technol. B 13, 435 (1995).
3. W. A. de Heer, A. Chatelain, and D. Ugarte, Science 270, 1179 (1995).
4. P. G. Collins and A. Zettl, Appl. Phys. Lett. 69, 1969 (1996).
5. R. Saito, M. Fujita, G. Dresselhaus, and M. S. Dresselhaus, Appl. Phys. Lett. 60, 2204 (1992).
6. J. W. G. Wildoer, L. C. Venema, A. G. Rinzler, R. E. Smalley, and C. Dekker, Nature (London) 391, 59 (1998).
7. R. Tamura and M. Tsukada, Phys. Rev. B 52, 6015 (1995).
8. D. L. Carroll, P. Redlich, P. M. Ajayan, J. C. Charlier, X. Blasé, A. De Vita, and R. Car, Phys. Rev. Lett. 78, 2811 (1997).
9. Y. Saito, K. Hamaguchi, T. Nishino, K. Hata, K. Tohiji, A. Kasuya, and Y. Nishina, Jpn. J. Appl. Phys., Part 1 36, 1340 (1997).
10. W. A. deHeer, J.-M. Bonard, T. Stockli, A. Chatelain, L. Forro, and D. Ugarte, Z. Phys. D 40, 418 (1997).
11. Materials and Electrochemical Research Corporation, Tuscon, AZ.
12. I. Brodie, Surf. Sci. 70, 186 (1978).
13. J. W. Gadzuk and E. W. Plummer, Rev. Mod. Phys. 45, 487 (1973).
14. J. A. Becker, in Advances in Catalysis, edited by W. G. Frankenburg, E. K. Rideal, and V. I. Komarewsky (Academic, New York, 1955), Vol. VII, pp. 184-187.
15. H. Morikawa, K. Okamoto, Y. Yoshino, F. Iwatsu, and T. Terao, Jpn. J. Appl. Phys., Part 1 36, 583 (1997).
16. R. H. Fowler and L. W. Nordheim, Proc. R. Soc. London, Ser. A 119, 173 (1928).
17. A. P. Komar and A. A. Komar, Sov. Phys. Tech. Phys. 7, 634 (1963).
18. F. Ashworth, Advances in Electronics 3, 1 (1951).
19. D. J. Rose, J. Appl. Phys. 27, 215 (1956).
20. V. T. Binh, N. Garcia, and S. T. Purcell, in Advances in Imaging and Electron Physics, edited by P. Hawkes (Academic, New York, 1996), Vol. 95, pp. 63-153.
21. R. Gaisch, R. Berndt, J. K. Gimezewski, B. Reihl, R. R. Schlittler, W. D. Schneider, and M. Tschudy, Appl. Phys. A: Mater. Sci. Process. 57, 207 (1993).
22. X.-D. Wang, T. Hashizume, H. Shinohara, Y. Saito, Y. Nishina, and T. Sakurai, Phys. Rev. B 47, 15923 (1993).