Experimental studies of the cap structure of single-walled carbon nanotubes

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 21, Issue 2, 2003, Pages 868-871

  Dean, Kenneth A ^a   Chalamala, Babu R ^b  

^a MOTOROLA INC   (United States)

^b MCNC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; ELECTRONIC STRUCTURE; FIELD EMISSION MICROSCOPES; SCANNING TUNNELING MICROSCOPY;

FIELD EVAPORATION CYCLES;

CARBON NANOTUBES;

EID: 0037276704     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1559171     Document Type: Article

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