Field Emission of Individual Carbon Nanotubes in the Scanning Electron Microscope

Physical Review Letters

Volumn 89, Issue 19, 2002, Pages

  Bonard, Jean Marc ^a   Dean, Kenneth A ^b   Coll, Bernard F ^b   Klinke, Christian ^a  

^a EPFL   (Switzerland)

^b MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTRODES; FIELD EMISSION MICROSCOPES; HIGH RESOLUTION ELECTRON MICROSCOPY; MATHEMATICAL MODELS; SCANNING ELECTRON MICROSCOPY;

FOWLER-NORDHEIM LAW; INTERELECTRODE DISTANCE; NANOTUBE RADIUS;

CARBON NANOTUBES;

EID: 0037021309     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.89.197602     Document Type: Article

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