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Volumn 146, Issue 1, 1999, Pages 312-327

Field emission energy distributions from individual multiwalled carbon nanotubes

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; ELECTRIC POTENTIAL; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPES; ELECTRON RESONANCE; NANOTUBES; THERMIONIC EMISSION; TUNGSTEN;

EID: 0032656064     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00056-2     Document Type: Article
Times cited : (247)

References (43)
  • 1
    • 0342819025 scopus 로고
    • Helical microtubules of graphitic carbon
    • Iijima S. Helical microtubules of graphitic carbon. Nature. 354:1991;56-58.
    • (1991) Nature , vol.354 , pp. 56-58
    • Iijima, S.1
  • 4
    • 0000516567 scopus 로고    scopus 로고
    • Unique characteristics of cold cathode carbon-nanotube-matrix field emitters
    • Collins P.G., Zettl A. Unique characteristics of cold cathode carbon-nanotube-matrix field emitters. Phys. Rev. B. 55(15):1997;9391-9399.
    • (1997) Phys. Rev. B , vol.55 , Issue.15 , pp. 9391-9399
    • Collins, P.G.1    Zettl, A.2
  • 6
    • 9744279393 scopus 로고
    • A carbon nanotube field emission electron source
    • de Heer W.A., Châtelain A., Ugarte D. A carbon nanotube field emission electron source. Science. 270:1995;1179-1180.
    • (1995) Science , vol.270 , pp. 1179-1180
    • De Heer, W.A.1    Châtelain, A.2    Ugarte, D.3
  • 8
    • 0032022154 scopus 로고    scopus 로고
    • Cathode ray tube lighting elements with carbon nanotube field emitters
    • Part 2
    • Saito Y., Uemura S., Hamaguchi K. Cathode ray tube lighting elements with carbon nanotube field emitters. Jpn. J. Appl. Phys. 37(3 B):1998;L346-L348. Part 2.
    • (1998) Jpn. J. Appl. Phys. , vol.37 , Issue.3 B
    • Saito, Y.1    Uemura, S.2    Hamaguchi, K.3
  • 12
    • 0000731763 scopus 로고
    • Electronic states of the cap structure in the carbon nanotube
    • Tamura R., Tsukada M. Electronic states of the cap structure in the carbon nanotube. Phys. Rev. B. 52(8):1995;6015-6026.
    • (1995) Phys. Rev. B , vol.52 , Issue.8 , pp. 6015-6026
    • Tamura, R.1    Tsukada, M.2
  • 17
    • 0026140042 scopus 로고
    • The physics of field emission in the context of vacuum microelectronics
    • Johnston R. The physics of field emission in the context of vacuum microelectronics. Surf. Sci. 246:1991;64-68.
    • (1991) Surf. Sci. , vol.246 , pp. 64-68
    • Johnston, R.1
  • 20
    • 0003437938 scopus 로고
    • Harvard Univ. Press (reprinted from the American Institute of Physics, (2nd edn.
    • R. Gomer, Field emission and field ionization, Harvard Univ. Press (reprinted from the American Institute of Physics, 1961 (2nd edn., 1993)).
    • (1961) Field Emission and Field Ionization
    • Gomer, R.1
  • 21
    • 0011133558 scopus 로고
    • Observation of surface-state emission in the energy distribution of electrons field-emitted from (100) oriented Ge
    • Shepherd W.B., Peria W.T. Observation of surface-state emission in the energy distribution of electrons field-emitted from (100) oriented Ge. Surf. Sci. 38:1973;461-498.
    • (1973) Surf. Sci. , vol.38 , pp. 461-498
    • Shepherd, W.B.1    Peria, W.T.2
  • 22
    • 0029519908 scopus 로고
    • Emission characteristics of ion-implanted silicon emitter tips
    • Part 1
    • Hirano T., Kanemaru S., Tanoue H., Itoh J. Emission characteristics of ion-implanted silicon emitter tips. Jpn. J. Appl. Phys. 34(12 B):1995;6907-6911. Part 1.
    • (1995) Jpn. J. Appl. Phys. , vol.34 , Issue.12 B , pp. 6907-6911
    • Hirano, T.1    Kanemaru, S.2    Tanoue, H.3    Itoh, J.4
  • 24
    • 36149009023 scopus 로고
    • Theoretical total-energy distribution of field-emitted electrons
    • Young R.D. Theoretical total-energy distribution of field-emitted electrons. Phys. Rev. 113(1):1959;110-114.
    • (1959) Phys. Rev. , vol.113 , Issue.1 , pp. 110-114
    • Young, R.D.1
  • 25
    • 0002917356 scopus 로고
    • Theory of field emission from semiconductors
    • Stratton R. Theory of field emission from semiconductors. Phys. Rev. 125(1):1962;67-82.
    • (1962) Phys. Rev. , vol.125 , Issue.1 , pp. 67-82
    • Stratton, R.1
  • 26
    • 33748781574 scopus 로고
    • Energy distributions of field emitted electrons
    • Stratton R. Energy distributions of field emitted electrons. Phys. Rev. 135(3 A):1964;A794-A805.
    • (1964) Phys. Rev. , vol.135 , Issue.3 A
    • Stratton, R.1
  • 27
    • 0001657359 scopus 로고    scopus 로고
    • Bias voltage dependent field-emission energy distribution analysis of wide band-gap field emitters
    • Schlesser R., McClure M.T., McCarson B.L., Sitar Z. Bias voltage dependent field-emission energy distribution analysis of wide band-gap field emitters. J. Appl. Phys. 82(11):1997;5763-5772.
    • (1997) J. Appl. Phys. , vol.82 , Issue.11 , pp. 5763-5772
    • Schlesser, R.1    McClure, M.T.2    McCarson, B.L.3    Sitar, Z.4
  • 28
    • 0000110626 scopus 로고
    • Field emission from narrow bands above the Fermi level of nanometer-scale objects
    • Purcell S.T., Binh V.T., García N., Lin M.E., Andres R.P., Reifenberger R. Field emission from narrow bands above the Fermi level of nanometer-scale objects. Phys. Rev. B. 49(24):1994;17259-17263.
    • (1994) Phys. Rev. B , vol.49 , Issue.24 , pp. 17259-17263
    • Purcell, S.T.1    Binh, V.T.2    García, N.3    Lin, M.E.4    Andres, R.P.5    Reifenberger, R.6
  • 36
    • 0019622051 scopus 로고
    • Energy broadening in field emitted electron and ion beams
    • Knauer W. Energy broadening in field emitted electron and ion beams. Optik. 59(4):1981;335-354.
    • (1981) Optik , vol.59 , Issue.4 , pp. 335-354
    • Knauer, W.1
  • 38
    • 0030126336 scopus 로고    scopus 로고
    • Probing electrical transport in nanomaterials: Conductivity of individual carbon nanotubes
    • Dai H., Wong E.W., Lieber C.M. Probing electrical transport in nanomaterials: conductivity of individual carbon nanotubes. Science. 272:1996;523-526.
    • (1996) Science , vol.272 , pp. 523-526
    • Dai, H.1    Wong, E.W.2    Lieber, C.M.3
  • 40
    • 36149036723 scopus 로고
    • The influence of surface treatment on field emission from silicon microemitters
    • Miller A.J., Johnston R. The influence of surface treatment on field emission from silicon microemitters. J. Phys.: Condens. Matter. 3:1991;S231-S236.
    • (1991) J. Phys.: Condens. Matter , vol.3
    • Miller, A.J.1    Johnston, R.2
  • 41
    • 0344548731 scopus 로고    scopus 로고
    • Energy distributions of field emitted electrons from carbide tips and tungsten tips with diamondlike carbon coatings
    • Yu M.L., Kim H.S., Hussey B.W., Chang T.H.P., Mackie W.A. Energy distributions of field emitted electrons from carbide tips and tungsten tips with diamondlike carbon coatings. J. Vac. Sci. Technol. B. 14(6):1996;3797-3801.
    • (1996) J. Vac. Sci. Technol. B , vol.14 , Issue.6 , pp. 3797-3801
    • Yu, M.L.1    Kim, H.S.2    Hussey, B.W.3    Chang, T.H.P.4    Mackie, W.A.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.