Field electron emission from individual carbon nanotubes of a vertically aligned array

Applied Physics Letters

Volumn 81, Issue 2, 2002, Pages 343-345

  Semet, V ^a   Binh, Vu Thien ^a   Vincent, P ^a   Guillot, D ^a   Teo, K B K ^b   Chhowalla, M ^b   Amaratunga, G A J ^b   Milne, W I ^b   Legagneux, P ^c   Pribat, D ^c  

^a UNIVERSITÉ LYON 1   (France)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c THALES RESEARCH AND TECHNOLOGY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONDITIONING PROCESS; FIELD ELECTRON EMISSIONS; FIELD EMISSION MECHANISM; FOWLER-NORDHEIM; ROOM TEMPERATURE; SCANNING ANODE FIELD EMISSION MICROSCOPES; SI WAFER; STABLE EMISSIONS; VERTICALLY ALIGNED;

ADSORPTION; ELECTRONS; FIELD EMISSION MICROSCOPES; MULTIWALLED CARBON NANOTUBES (MWCN); SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS;

ELECTRON EMISSION;

EID: 79956017781     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1489084     Document Type: Article

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