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Journal of Microscopy

Volumn 203, Issue 2, 2001, Pages 188-194

Microscopy and computational modelling to elucidate the enhancement factor for field electron emitters

(2) Edgcombe, C J a,b Valdre U c

a UNIVERSITY OF CAMBRIDGE (United Kingdom)

b Granta Electronics Ltd (United Kingdom)

c UNIVERSITY OF BOLOGNA (Italy)

Author keywords

Carbon contamination; Carbon nanotips; Field emitters; Field enhancement factor; Field factor; Finite element computation; Fowler Nordheim plots; Reduction factor; Scanning electron microscopy; Threshold field; Threshold voltage

Indexed keywords

ANODES; CARBON; FIELD EMISSION; GEOMETRY; SCANNING ELECTRON MICROSCOPY;

CARBON CONTAMINATION; CARBON NANOTIPS; FIELD EMITTER; FIELD ENHANCEMENT FACTOR; FIELD FACTORS; FINITE ELEMENT COMPUTATIONS; FOWLER-NORDHEIM PLOTS; REDUCTION FACTOR; THRESHOLD FIELDS;

THRESHOLD VOLTAGE;

CARBON;

ARTICLE; CONTAMINATION; ELECTRIC FIELD; ELECTRIC POTENTIAL; FINITE ELEMENT ANALYSIS; MATHEMATICAL COMPUTING; MATHEMATICAL MODEL; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY;

EID: 0034925281 PISSN: 00222720 EISSN: None Source Type: Journal
DOI: 10.1046/j.1365-2818.2001.00890.x Document Type: Article

Times cited : (205)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.