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Volumn 88, Issue 22, 2006, Pages
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Structural and electrical characterizations of the pulsed-laser-deposition- grown Sc2O3/GaN heterostructure
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE MEASUREMENT;
GALLIUM NITRIDE;
HETEROJUNCTIONS;
INTERFACES (MATERIALS);
LEAKAGE CURRENTS;
MOS DEVICES;
SAPPHIRE;
SCANDIUM COMPOUNDS;
SINGLE CRYSTALS;
TRANSMISSION ELECTRON MICROSCOPY;
VOLTAGE MEASUREMENT;
X RAY DIFFRACTION;
X RAY PHOTOELECTRON SPECTROSCOPY;
HETEROINTERFACE;
REVERSE GATE BIAS;
SAPPHIRE TEMPLATE;
VALENCE BAND;
PULSED LASER DEPOSITION;
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EID: 33744801086
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2209178 Document Type: Article |
Times cited : (27)
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References (14)
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