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Volumn 88, Issue 22, 2006, Pages

Structural and electrical characterizations of the pulsed-laser-deposition- grown Sc2O3/GaN heterostructure

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; GALLIUM NITRIDE; HETEROJUNCTIONS; INTERFACES (MATERIALS); LEAKAGE CURRENTS; MOS DEVICES; SAPPHIRE; SCANDIUM COMPOUNDS; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; VOLTAGE MEASUREMENT; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33744801086     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2209178     Document Type: Article
Times cited : (27)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.