Probing the conducting paths in a metal-insulator composite by conducting atomic force microscopy

Journal of Physics D: Applied Physics

Volumn 29, Issue 12, 1996, Pages 3169-3172

  Luo, E Z ^a   Ma, J X ^a,c   Xu, J B ^a   Wilson, I H ^a   Pakhomov, A B ^b,d   Yan, X ^b  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^c NANJING UNIVERSITY   (China)

^d IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITE MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRON TUNNELING; ELECTRONS; MORPHOLOGY; NICKEL COMPOUNDS; PERCOLATION (SOLID STATE); SURFACES;

CONDUCTING PATHS; METAL INSULATOR COMPOSITE; PERCOLATION THRESHOLD;

ELECTRON TRANSPORT PROPERTIES;

EID: 0030411820     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/29/12/036     Document Type: Article

References (8)

1. Cody G D, Geballe T H and Sheng Ping (eds) 1990 Physical Phenomena in Granular Materials (Pittsburgh: MRS) and the references therein
2. Sheng P 1995 Introduction to Wave Scattering, Localization and Mesoscopic Phenomena (Boston, MA: Academic)
3. Viswanathan R and Heaney M B 1995 Phys. Rev. Lett. 75 4433-6
4. Pakhmov A B, Yan X and Zhao B 1995 Appl. Phys. Lett. 67 3497-9
5. See, e.g. Shafai C, Thomson D J, Simard-Normandin M, Mattiussi G and Scanlon P J 1994 Appl. Phys. Lett. 64 342-4
6. Wolf P De, Snauwaert J, Clarysse T, Vandervorst W and Hellemans L 1995 Appl. Phys. Lett. 66 1530-2
7. Jing X N, Wang N, Pakhomov A B, Fung K K and Yan X 1996 Phys. Rev. B 53 1-4
8. Luo E Z, Wilson I H, Xu J B, Ma J X and Yan X unpublished