A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations

IEEE Transactions on Instrumentation and Measurement

Volumn 55, Issue 3, 2006, Pages 902-915

  Olleta, Beatriz ^a   Jiang, Hanjun ^b   Chen, Degang ^c   Geiger, Randall L ^c  

^a Whiting School of Engineering   (United States)

^b TEXAS INSTRUMENTS   (United States)

^c Iowa State University   (United States)

Author keywords

Analog to digital converter (ADC) testing; Built in self test (BIST); Dynamic element matching (DEM); Integral nonlinearity (INL) testing

Indexed keywords

BUILT-IN SELF TEST; COMPUTER CIRCUITS; COMPUTER SIMULATION; MATHEMATICAL MODELS;

ANALOG-TO-DIGITAL TESTING; DYNAMIC ELEMENT MATCHING; INTEGRAL NONLINEARITY TESTING;

ANALOG TO DIGITAL CONVERSION;

EID: 33744770293     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2006.873821     Document Type: Article

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