A modified histogram approach for accurate self-characterization of analog-to-digital converters

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 2, Issue , 2002, Pages

  Parthasarathy, Kumar L ^a   Jin, Le ^a   Chen, Degang ^a   Geiger, Randall ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BUILT-IN SELF TEST; COMPUTER ARCHITECTURE; COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; SIGNAL NOISE MEASUREMENT; SPURIOUS SIGNAL NOISE;

CODE DENSITY TESTS; HISTOGRAM; LOW SPECTRAL PURITY INPUT SIGNAL;

ANALOG TO DIGITAL CONVERSION;

EID: 0036287087     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Full-speed testing of A/D converters
2. Histogram measurement of ADC nonlinearities using sine waves
3. Linearity testing issues of analog to digital converters
4. A BIST scheme for on-chip ADC and DAC testing
5. Accurate self characterization and correction of A/D converter performance