Built-In Self-Test methodology for A/D converters

Proceedings of European Design and Test Conference

Volumn , Issue , 1997, Pages 353-358

  de Vries, R ^a   Zwemstra, T ^a   Bruls, E M J G ^a   Regtien, P P L ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; INTEGRATED CIRCUIT TESTING; MIXER CIRCUITS; NATURAL FREQUENCIES; STATISTICAL TESTS;

BUILT IN SELF TEST (BIST) METHODOLOGY; LEAST SIGNIFICANT BIT (LSB);

CODE CONVERTERS;

EID: 0030706519     PISSN: 10661409     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)