A frequency response, harmonic distortion, and intermodulation distortion test for BIST of a Sigma-Delta ADC

IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing

Volumn 43, Issue 8, 1996, Pages 608-613

  Toner, M F ^a   Roberts, G W ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; FAST FOURIER TRANSFORMS; FREQUENCY RESPONSE; HARMONIC GENERATION; INTEGRATED CIRCUIT TESTING; INTERMODULATION; SIGNAL DISTORTION; SIGNAL FILTERING AND PREDICTION; VLSI CIRCUITS;

BUILT IN SELF TEST; DIGITAL TESTING; HARMONIC DISTORTION; INTERMODULATION DISTORTION;

ANALOG TO DIGITAL CONVERSION;

EID: 0030211411     PISSN: 10577130     EISSN: None     Source Type: Journal    
DOI: 10.1109/82.532008     Document Type: Article

References (11)

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