A high accuracy triangle-wave signal generator for on-chip ADC testing

Proceedings of the European Test Workshop

Volumn 2002-January, Issue January, 2002, Pages 89-91

  Bernard, S ^a   Azais F ^a   Bertrand, Y ^a   Renovell, M ^a  

^a UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; SIGNAL GENERATORS;

BIST ARCHITECTURES; CALIBRATION SCHEMES; CONTROL CIRCUITRY; DIGITAL OUTPUT; INTERNAL GENERATION; LINEAR SIGNALS; TEST TECHNIQUES; TRIANGLE WAVES;

RAMP GENERATORS;

EID: 34548369144     PISSN: 15301877     EISSN: 15581780     Source Type: Conference Proceeding    
DOI: 10.1109/ETW.2002.1029644     Document Type: Conference Paper

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