BIST and Production Testing of ADCs Using Imprecise Stimulus

ACM Transactions on Design Automation of Electronic Systems

Volumn 8, Issue 4, 2003, Pages 522-545

  Parthasarathy, Kumar ^a   Kuyel, Turker ^a   Price, Dana ^b   Jin, Le ^c   Chen, Degang ^c   Geiger, Randall ^c  

^a TEXAS INSTRUMENTS   (United States)

^b MOTOROLA INC   (United States)

^c Iowa State University of Science and Technology   (United States)

Author keywords

ADC linearity; Analog and mixed signal testing; Built in self test; Imprecision measurement; Imprecision stimulus; Production test

Indexed keywords

ALGORITHMS; BUILT-IN SELF TEST; COMPUTER SIMULATION; CONTROL NONLINEARITIES; DIGITAL INTEGRATED CIRCUITS; FAULT TOLERANT COMPUTER SYSTEMS;

DEVICE-UNDER-TEST (DUT);

ANALOG TO DIGITAL CONVERSION;

EID: 0142126893     PISSN: 10844309     EISSN: None     Source Type: Journal    
DOI: 10.1145/944027.944035     Document Type: Article

References (14)

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