Linearity testing of precision analog-to-digital converters using stationary nonlinear inputs

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 218-227

  Jin, Le ^a   Parthasarathy, Kumar ^b   Kuyel, Turker ^b   Chen, Degang ^a   Geiger, Randall L ^a  

^a Iowa State University of Science and Technology   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; BUILT-IN SELF TEST; COMPUTER HARDWARE; COST EFFECTIVENESS; ELECTRONIC EQUIPMENT TESTING;

HISTOGRAMS;

DELTA SIGMA MODULATION;

EID: 0142153737     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. M. Bums and G. W. Roberts, "An Introduction to Mixed-Signal IC Test and Measurement," Oxford University Press, New York, USA 2000.
2. J. Doernberg, H. S. Lee, and D. A. Hodges, "Full-Speed Testing of A/D Converters," IEEE J. Solid-State Circuits, December 1984, SC-19, pp.820-827.
3. J. Blair, "Histogram measurement of ADC nonlinearities using sine waves," IEEE Trans. Instrum. Meas., Vol.43, pp.373-383, June 1994.
4. T. Kuyel, "Linearity Testing Issues of Analog to Digital Converters," IEEE International Test Conference, pp. 747-756, 1999.
5. T. Kuyel, H. Bilhan, "Relating Linearity Test Results to Design Flaws of Pipelined Analog to Digital Converters," IEEE International Test Conference, pp. 772-779, 1999
6. T. Kuyel, F. Tsay, "Optimal Trim Techniques for Improving the Linearity of Pipeline ADCs," IEEE International Test Conference, pp. 367-375, 2000
7. K. L. Parthasarathy, L. Jin, D. Chen, and R. L. Geiger, "A Modified Histogram Approach for Accurate Self-Characterization of Analog-to-Digital Converters", IEEE ISCAS, Arizona, May 2002.
8. L. Jin, K. L. Parthasarathy, D. Chen, and R. L. Geiger, "A Blind Identification Approach to Digital Calibration of Analog-to-Digital Converters for Built-In-Self-Test", IEEE ISCAS, Arizona, May 2002.