Study of the early stages of Cr/6H-SiC(0 0 0 1) interface formation

Applied Surface Science

Volumn 252, Issue 15, 2006, Pages 5312-5315

  Dontas, I ^a   Karakalos, S ^a   Ladas, S ^a   Kennou, S ^a  

^a UNIVERSITY OF PATRAS   (Greece)

Author keywords

Chromium; Ohmic metal contacts; Silicon carbide

Indexed keywords

BINDING ENERGY; CHROMIUM; EVAPORATION; INTERFACES (MATERIALS); MONOLAYERS; OHMIC CONTACTS; POLYCRYSTALLINE MATERIALS; SCHOTTKY BARRIER DIODES; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMISORBED OXYGEN; CORE LEVEL PEAKS; INTERFACIAL SILICIDE-LIKE INTERACTION; OHMIC METAL CONTACTS;

SILICON CARBIDE;

EID: 33744533396     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.12.066     Document Type: Article

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