Surface structure and morphology induced by ultrathin Ti films on 6H-SiC(0001) and (0001)

Surface Science

Volumn 364, Issue 1, 1996, Pages 54-60

  Li, L ^a   Tsong, I S T ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Low index single crystal surfaces; Metallic films; Scanning tunneling microscopy; Silicon carbide; Surface structure, morphology, roughness, and topography

Indexed keywords

ANNEALING; COMPOSITION; CRYSTAL GROWTH; DEPOSITION; MATHEMATICAL MODELS; MORPHOLOGY; ORDER DISORDER TRANSITIONS; SCANNING TUNNELING MICROSCOPY; SILICON CARBIDE; SURFACE ROUGHNESS; SURFACE STRUCTURE; ULTRATHIN FILMS;

DISORDERED PHASE; LOW INDEX SINGLE CRYSTAL SURFACES; ORDERED PHASE; ULTRATHIN TITANIUM FILMS; VOLMER-WEBER GROWTH;

SURFACES;

EID: 0030215682     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00582-1     Document Type: Article

References (13)

1. S. Morozumi, M. Endo, M. Kikuchi and K. Hamajima, J. Mat. Sci. 20 (1985) 3976.
2. S.K. Choi, M. Chandrasekaran and M.J. Brabers, J. Mat. Sci. 25 (1990) 1957.
3. I.W. Hall, J.L. Lirn, Y. Lepetitcorps and K. Bilba, J. Mat. Sci. 27 (1992) 3835.
4. I. Gotman, E.Y. Gutmanas and P. Mogilevsky, J. Mat. Res. 8 (1993) 2725.
5. J.S. Bow, L.M. Porter, M.J. Kim, R.W. Carpenter and R.F. Davis, Ultramicroscopy 52 (1993) 289.
6. L.M. Porter, R.F. Davis, J.S. Bow, M.J. Kim, R.W. Carpenter and R.C. Glass, J. Mat. Res. 10 (1995) 668.
7. L. Li and I.S.T. Tsong, Surf. Sci., to be published.
8. J.E. Northrup, Phys. Rev. Lett. 53 (1984) 683.
9. J. Nogami, Surf. Rev. Lett. 1 (1994) 395, and references therein.
10. P. Martineau, R. Pailler, M. Lahaye and R. Naslain, J. Mat. Sci. 19 (1984) 2749.
11. M.H. Tsai, C.S. Chang, J.D. Dow and I.S.T. Tsong, Phys. Rev. B 45 (1992) 1327.
12. P. Mårtensson, G. Meyer, N.M. Amer, E. Kaxiras and K.C. Pandey, Phys. Rev. B 42 (1990) 7230.
13. H.B. Elswijk, D. Dijkkamp and E.J. van Loenen, Phys. Rev. B 44 (1991) 3802.