Nondestructive in-depth composition profile of oxy-hydroxide nanolayers on iron surfaces from ARXPS measurement

Surface and Interface Analysis

Volumn 38, Issue 5, 2006, Pages 964-974

  Olla, Maurizio ^a,b   Navarra, Gabriele ^a   Elsener, Bernhard ^a,b   Rossi, Antonella ^a,b,c  

^a UNIVERSITY OF CAGLIARI   (Italy)

^b INSTM   (Italy)

^c Dipto di Chim Inorg ed Analitica   (Italy)

Author keywords

ARXPS; Composition profile; Iron; MEM; Nanolayer

Indexed keywords

ALGORITHMS; COMPOSITION; COMPUTER SIMULATION; ENTROPY; GAUSSIAN NOISE (ELECTRONIC); MEASUREMENT THEORY; MULTILAYERS; NONDESTRUCTIVE EXAMINATION; THIN FILMS;

ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPY (ARXPS); COMPOSITION PROFILES; MAXIMUM ENTROPY METHODS (MEM); NANOLAYERS;

IRON METALLOGRAPHY;

EID: 33646566347     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2362     Document Type: Article

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