Determination of the concentration of surface hydroxyl groups on metal oxide films by a quantitative XPS method

Surface and Interface Analysis

Volumn 26, Issue 8, 1998, Pages 549-564

  McCafferty, E ^a   Wightman, J P ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILMS; METALS; OXIDES; SURFACE PHENOMENA; X RAY PHOTOELECTRON SPECTROSCOPY;

HYDROXYL GROUPS;

HYDROXYLATION;

EID: 0032120235     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199807)26:8<549::AID-SIA396>3.0.CO;2-Q     Document Type: Article

References (71)