Molecular dynamics simulations of the atomistic structure of the intergranular film between silicon nitride grains: Effect of composition, thickness, and surface vacancies

Materials Science and Engineering: A

Volumn 422, Issue 1-2, 2006, Pages 115-122

  Garofalini, Stephen H ^a  

^a Piscataway   (United States)

Author keywords

Interfaces; Molecular dynamics simulations; Structure

Indexed keywords

COMPOSITION; COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; GRANULAR MATERIALS; INTERFACES (MATERIALS); MOLECULAR DYNAMICS;

INTERGRANULAR FILMS; MOLECULAR DYNAMICS SIMULATIONS; SURFACE VACANCIES;

SILICON NITRIDE;

COMPOSITION; COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; GRANULAR MATERIALS; INTERFACES (MATERIALS); MOLECULAR DYNAMICS; SILICON NITRIDE;

EID: 33645923736     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2006.01.009     Document Type: Article

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