Observation of surface charging at the edge of a Schottky contact

IEEE Electron Device Letters

Volumn 27, Issue 4, 2006, Pages 211-213

  Sabuktagin, Shahriar ^a   Moon, Yong Tae ^a   Dogan, Seydi ^a   Baski, A A ^a   Morkoç, Hadis ^a  

^a VIRGINIA COMMONWEALTH UNIVERSITY   (United States)

Author keywords

Edge effects; Frequency dispersion; Scanning Kelvin probe microscopy (SKPM); Surface potential

Indexed keywords

ELECTRON TUNNELING; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GALLIUM COMPOUNDS;

EDGE EFFECTS; FREQUENCY DISPERSION; SCANNING KELVIN PROBE MICROSCOPY; SCHOTTKY CONTACT; SURFACE POTENTIAL;

SCHOTTKY BARRIER DIODES;

EID: 33645642610     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2006.871177     Document Type: Article

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