Dynamic power-supply and well noise measurements and analysis for low power body biased circuits

IEICE Transactions on Electronics

Volumn E88-C, Issue 4, 2005, Pages 589-596

  Shimazaki, Kenji ^a,b,c   Nagata, Makoto ^b,d   Okumoto, Takeshi ^a,e   Hirano, Shozo ^a,c   Tsujikawa, Hiroyuki ^a,c  

^a PANASONIC CORPORATION   (Japan)

^b KOBE UNIVERSITY   (Japan)

^c Semiconductor Company   (Japan)

^d Technical Program Committee

^e Advanced LSI Technology Development Center   (Japan)

Author keywords

Dynamic IR drop; Ground noise; Noise detector; Power supply noise; Substrate noise

Indexed keywords

CHIP SCALE PACKAGES; NETWORKS (CIRCUITS); ROBUSTNESS (CONTROL SYSTEMS); SPURIOUS SIGNAL NOISE; SUBSTRATES;

DYNAMIC IR DROP; GROUND NOISE; NOISE DETECTORS; POWER-SUPPLY NOISE; SUBSTRATE NOISE;

ELECTRIC POWER SYSTEMS;

EID: 33645570227     PISSN: 09168524     EISSN: 17451353     Source Type: Journal    
DOI: 10.1093/ietele/e88-c.4.589     Document Type: Article

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