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Volumn , Issue CIRCUITS SYMP., 2004, Pages 94-97
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Dynamic power-supply and well noise measurement and analysis for high frequency body-biased circuits
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
DETECTOR CIRCUITS;
LSI CIRCUITS;
ROBUSTNESS (CONTROL SYSTEMS);
SPURIOUS SIGNAL NOISE;
SUBSTRATES;
WAVEFORM ANALYSIS;
DYNAMIC POWER SUPPLY;
HIGH FREQUENCY BODY-BIASED CIRCUITS;
PARASITIC EXTRACTORS;
WELL NOISE;
POWER SUPPLY CIRCUITS;
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EID: 4544377993
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (20)
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References (5)
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