메뉴 건너뛰기




Volumn 19, Issue 6, 2000, Pages 671-678

Measurements and analyses of substrate noise waveform in mixed-signal 1C environment

Author keywords

Mixed analog digital integrated circuits; Signal integrity; Substrate coupling; Substrate noise measurements

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPARATOR CIRCUITS; COMPUTER SIMULATION; ELECTRIC POWER SUPPLIES TO APPARATUS; EQUIVALENT CIRCUITS; SEMICONDUCTOR DEVICE TESTING; SUBSTRATES; THRESHOLD VOLTAGE;

EID: 0033707515     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.848088     Document Type: Article
Times cited : (71)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.