|
Volumn 19, Issue 6, 2000, Pages 671-678
|
Measurements and analyses of substrate noise waveform in mixed-signal 1C environment
a a a a |
Author keywords
Mixed analog digital integrated circuits; Signal integrity; Substrate coupling; Substrate noise measurements
|
Indexed keywords
CMOS INTEGRATED CIRCUITS;
COMPARATOR CIRCUITS;
COMPUTER SIMULATION;
ELECTRIC POWER SUPPLIES TO APPARATUS;
EQUIVALENT CIRCUITS;
SEMICONDUCTOR DEVICE TESTING;
SUBSTRATES;
THRESHOLD VOLTAGE;
LATCH COMPARATOR;
SIGNAL INTEGRITY;
SOFTWARE PACKAGE SPICE;
SUBSTRATE COUPLING;
SUBSTRATE NOISE MEASUREMENTS;
SPURIOUS SIGNAL NOISE;
|
EID: 0033707515
PISSN: 02780070
EISSN: None
Source Type: Journal
DOI: 10.1109/43.848088 Document Type: Article |
Times cited : (71)
|
References (13)
|