Imaging defects on CaF2(111) surface with frequency modulation atomic force microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 3 B, 2006, Pages 1986-1991

  Fujii, Shintaro ^a   Fujihira, Masamichi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Atomic force microscopy; CaF2(111); Defect; Ultrahigh vacuum

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; DEFECTS; FREQUENCY MODULATION; IMAGING SYSTEMS; POSITIVE IONS; SURFACE PROPERTIES; ULTRAHIGH VACUUM;

ATOMIC PERIODICITY; CAF2(111); HIGH-RESOLUTION IMAGING; TIP-TERMINATING IONS;

CALCIUM COMPOUNDS;

EID: 33645550876     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.1986     Document Type: Article

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33. In some cases, a sudden shift in the position of the tip-terminating ion can be observed just as a shift in the sublattice in an FM-AFM image. In Fig. 3(a), such a tip change is seen in the middle of the image during the scan from top to bottom. In contrast to the change in the sign of the tip-terminating ion in Fig. 7(d), the atomic contrast pattern of the sublattice in Fig. 3(a) remained unchanged after the tip change. It is interesting to note that the tip-terminating ion was likely to gradually shift again to the original position after the tip change. As shown in Fig. 3(a), the atomic row of the shifted sublattice in the middle of the image approached asymptotically a white line extrapolated from the atomic row of the sublattice in the upper part.