Advanced defect and impurity diagnostics in silicon based on carrier lifetime measurements

Physica Status Solidi (A) Applications and Materials Science

Volumn 203, Issue 4, 2006, Pages 732-746

  Warta, W ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER TRAPPING; LIFETIME SPECTROSCOPY; SUB-BANDGAP LIGHT; TEMPERATURE DEPENDENCE;

INFRARED RADIATION; OPTICAL RESOLVING POWER; PARAMETER ESTIMATION; THERMAL EFFECTS;

SILICON;

EID: 33645325926     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200564510     Document Type: Review

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