Carrier Density Imaging as a Tool for Characterising the Electrical Activity of Defects in Pre-Processed Multicrystalline Silicon

Solid State Phenomena

Volumn 95-96, Issue , 2004, Pages 229-234

  Riepe, S ^a   Stokkan, G ^b   Kieliba, T ^a   Warta, W ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

^b NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

CDI; Dislocations; Grain Boundaries; Minority Carrier Density; Multicrystalline Silicon

Indexed keywords

BESSEL FUNCTIONS; BOUNDARY CONDITIONS; CARRIER CONCENTRATION; CORRELATION METHODS; CRYSTAL DEFECTS; DIFFERENTIAL EQUATIONS; DIFFUSION; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; IMAGING TECHNIQUES; INTERPOLATION; SOLAR CELLS;

CARRIER DENSITY IMAGING (CDI); ETCH PIT DENSITY (EPD); LIGHT BEAM INDUCED CURRENT (LBIC); MINORITY CARRIER DENSITY; MULTICRYSTALLINE SILICON;

POLYSILICON;

EID: 1642438225     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (6)

1. J. Isenberg, S. Riepe and W.Warta: J. Appl. Phys. Vol. 93 No. 7 (2003), pp. 4268-4275
2. C. Donolato: J. Appl. Phys. Vol. 84 No. (1998), pp. 2656-2664
3. F. Secco D'Aragona: J. Electrochem. Soc. 119 (1972), pp. 948-951
4. A. J. Schwarz, M. Kumar and B. L. Adams: Electron Backscatter Diffraction in Materials Science (Kluwer Academic / Plenum Publishers, USA 2000)
5. M. Rinio, A. Hauser and H.J. Möller: Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion (Osaka 2003), to be published
6. M. Rinio, S. Peters and H.J. Möller: Sol. Stat. Phen. Vol. 82-84 (2002), pp.701