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Volumn 376-377, Issue 1, 2006, Pages 350-353

Positron study of electron irradiation-induced vacancy defects in SiC

Author keywords

Positron annihilation; SiC

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; DOPPLER EFFECT; ELECTRON IRRADIATION; POSITRON ANNIHILATION SPECTROSCOPY;

EID: 33645142949     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2005.12.090     Document Type: Conference Paper
Times cited : (14)

References (20)
  • 1
    • 18844459488 scopus 로고    scopus 로고
    • W.J. Choyke H. Matsunami G. Pensl Springer Berlin, Heidelberg, NY
    • A. Kawasuso W.J. Choyke H. Matsunami G. Pensl Silicon Carbide - Recent Major Advances 2004 Springer Berlin, Heidelberg, NY 563
    • (2004) Silicon Carbide - Recent Major Advances , pp. 563
    • Kawasuso, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.