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Volumn 103-104, Issue , 2005, Pages 315-322

Supercritical Co2 applications in BEOL cleaning

Author keywords

BEOL cleans; Carbon dioxide; Supercritical

Indexed keywords


EID: 33644955905     PISSN: 10120394     EISSN: 16629779     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/SSP.103-104.315     Document Type: Conference Paper
Times cited : (25)

References (24)
  • 1
    • 3042742547 scopus 로고    scopus 로고
    • 6 (2003), p G101-4, G. Levitin, S. Myneni, D.W. Hess, Cleaning Technology in Semiconductor Device Manufacturing, The Electrochemical Society Proceedings
    • G. Levitin, S. Myneni, D.W. Hess: Electrochemical and Solid-State Letters 6 (2003), p G101-4, G. Levitin, S. Myneni, D.W. Hess, Cleaning Technology in Semiconductor Device Manufacturing, The Electrochemical Society Proceedings 26, (2003) p.263-270.
    • (2003) Electrochemical and Solid-State Letters , vol.26 , pp. 263-270
    • Levitin, G.1    Myneni, S.2    Hess, D.W.3
  • 9
    • 33645351655 scopus 로고    scopus 로고
    • Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics, Editors: R.J. Carter, C.S. Hau-Riege, G.M. Kloster, T.-M. Lu, S.E. Schulz, p. F1, 9
    • B. Xie, M.J. Muscat, MRS Proceedings Vol. 812, Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics, Editors: R.J. Carter, C.S. Hau-Riege, G.M. Kloster, T.-M. Lu, S.E. Schulz, p. F1.4-1.9.
    • MRS Proceedings , vol.812 , pp. 4-11
    • Xie, B.1    Muscat, M.J.2
  • 12
    • 85042814695 scopus 로고    scopus 로고
    • Materials, Technology, and Reliability for Advanced Interconnects and Low-k Dielectrics, Editors: A. McKerrow, J. Leu, O. Kraft, T. Kikkawa
    • R.F. Reidy, Zhengping Zhang, R.A. Orozco-Teran, B.P. Gorman, D.W. Mueller: MRS Proceedings Vol 766, Materials, Technology, and Reliability for Advanced Interconnects and Low-k Dielectrics, Editors: A. McKerrow, J. Leu, O. Kraft, T. Kikkawa 2003, E6.10.
    • (2003) Mueller: MRS Proceedings , vol.766
    • Reidy, R.F.1    Zhengping Zhang, R.A.2    Orozco-Teran, B.P.3    Gorman, D.W.4
  • 13
    • 84954267428 scopus 로고    scopus 로고
    • http://www.lanl.gov/worldview/news/releases/archive/01-073.shtml.
  • 14
    • 0346158077 scopus 로고    scopus 로고
    • Alyssandrea Hamad, Christopher K. Ober
    • Victor Q. Pham, Robert J. Ferris, Alyssandrea Hamad, Christopher K. Ober: Chem. Mater. 15 (2003), p 4893-4895.
    • (2003) Chem. Mater. , vol.15 , pp. 4893-4895
    • Pham, V.Q.1    Ferris, R.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.