Functional Circuit Board Testing using Nanoscale Sensors

AUTOTESTCON (Proceedings)

Volumn , Issue , 2003, Pages 266-272

  Glenn Wright, R ^a   Zgol, Marek ^a   Adebimpe, David ^a   Kirkland, Larry V ^b  

^a GMA Industries Inc   (United States)

^b Air Force Materiel Command   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; COMPUTER SOFTWARE; ELECTRONIC EQUIPMENT TESTING; GRAPHICAL USER INTERFACES; PRINTED CIRCUIT BOARDS; SCANNING TUNNELING MICROSCOPY; SENSORS;

NANOSENSORS;

AUTOMATIC TESTING;

EID: 0142216094     PISSN: 07347510     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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3. http://www.radio-electronios.com/info/t_and_m/incircuit/iot.htm
4. Advanced Electronic Packaging: With Emphasis On Multi-Chip Modules, Editor: W. D. Brown, Chapter 12, Testing and Qualification, S. Kolluru and D. Berleant
5. Lee, et al., Chem. Phys. Lett 2001 (337) 398
6. Jiang, J. J. Phys. B.: At. Mol. Opt. Phys. 1998 (31) 3079
7. S. Huang, J.M. Tour, J. Am. Chem. Soc., 121, 4908-4909 (1999)
8. K. Yamamoto, S. Akita, and Y. Nakayama, J. Phys. D: Appl. Phys., 31 (8), L34-36 (1998).