Nanotechnology-based molecular test equipment (MTE)

IEEE Aerospace and Electronic Systems Magazine

Volumn 16, Issue 6, 2001, Pages 15-19

  Glenn Wright, R ^a   Zgol, Marek ^a   Keeton, Susanna ^a   Kirkland, Larry V ^b,c  

^a GMA Industries Inc   (United States)

^b USAF   (United States)

^c Air Force Materiel Command   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST EQUIPMENT (ATE); MOLECULAR TEST EQUIPMENT (MTE);

AUTOMATIC TESTING; COMPUTER SIMULATION; ELECTRONIC EQUIPMENT TESTING; INTEGRATED CIRCUIT MANUFACTURE; PRINTED CIRCUIT BOARDS; SUBSTRATES;

NANOTECHNOLOGY;

EID: 0035363292     PISSN: 08858985     EISSN: None     Source Type: Journal    
DOI: 10.1109/62.931131     Document Type: Article

References (4)