A practical implementation of BICS for safety-critical applications

Proceedings - 2000 IEEE International Workshop on Defect Based Testing

Volumn , Issue , 2000, Pages 51-56

  Smith, P A ^a   Campbell, D V ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; DIGITAL CONTROL SYSTEMS; MICROELECTRONICS; RECONFIGURABLE HARDWARE; SAFETY ENGINEERING;

BUILT-IN CURRENT SENSORS; DIGITAL CONTROL LOGIC; DIGITAL LOGIC; DIGITAL SIMULATION; QUIESCENT CURRENTS; REAL ESTATE; SAFETY CRITICAL APPLICATIONS; STATE OF HEALTH;

COMPUTER CIRCUITS;

EID: 84961875076     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DBT.2000.843690     Document Type: Conference Paper

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