Built-in current sensor for IDDQ test

Proceedings - 2004 IEEE International Workshop on Current and Defect Based Testing, DBT 2004

Volumn , Issue , 2004, Pages 3-9

  Xue, Bin ^a   Walker, D M H ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN CURRENT SENSOR (BICS); CALIBRATION DRIFT; DEFECT DIAGNOSIS; POWER DISSIPATION;

CALIBRATION; DIGITAL SIGNAL PROCESSING; DIGITAL TO ANALOG CONVERSION; ENERGY DISSIPATION; FLIP FLOP CIRCUITS; PERFORMANCE; READOUT SYSTEMS; SENSORS; SIGNAL TO NOISE RATIO; TECHNOLOGY TRANSFER;

BUILT-IN SELF TEST;

EID: 21444453912     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)

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