An investigation of 'cannot duplicate' failures

Quality and Reliability Engineering International

Volumn 14, Issue 5, 1998, Pages 331-337

  Williams, R ^a,c,d,e   Banner, J ^a,e,f,g   Knowles, I ^a,h,i,j,k,l   Dube, M ^b,m,n,o   Natishan, M ^b,p,q,r,s   Pecht, M ^b,t,u,v  

^a MINISTRY OF DEFENCE   (United Kingdom)

^b UNIVERSITY OF MARYLAND   (United States)

^c Direct Sensors and Electron Syst   (United Kingdom)

^d UNIVERSITY OF BRISTOL   (United Kingdom)

^e CALCE EPRC   (United States)

^f UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^g Directorate General of Submarines   (United Kingdom)

^h Direct of Procurem Mgmt Policy   (United Kingdom)

ⁱ De Havilland Aircraft Company   (United Kingdom)

^j UNIVERSITY OF LONDON   (United Kingdom)

^k UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^l Engineering Working Group   (United Kingdom)

^m INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

ⁿ BINGHAMTON UNIVERSITY   (United States)

^o ASME

^p UNIVERSITY OF MARYLAND   (United States)

^q UNIVERSITY OF VIRGINIA   (United States)

^r NAVAL SURFACE WARFARE CENTER   (United States)

^s Soc for Mach Prevention Technology

^t University of Wisconsin   (United States)

^u IEEE

^v Board of Advisors ^*

more..

Author keywords

'Cannot duplicate' failure; No fault found (NFF)

Indexed keywords

AVIONICS; BUILT-IN SELF TEST; COSTS; ELECTRONIC EQUIPMENT; ELECTRONIC EQUIPMENT TESTING; LIFE CYCLE; MAINTENANCE; STATISTICS;

ELECTRONIC BOARD; HIGHLY ACCELERATED LIFE CYCLE TESTING;

FAILURE ANALYSIS;

EID: 0032156721     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1099-1638(199809/10)14:5<331::aid-qre183>3.0.co;2-l     Document Type: Article

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