Role of BIT in support system maintenance and availability

IEEE Aerospace and Electronic Systems Magazine

Volumn 19, Issue 8, 2004, Pages 3-7

  Drees, Ron ^a   Young, Neal ^a  

^a BAE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST EQUIPMENT (ATE); DIGITAL SYNTHESIS; NON-DETECTION PERCENTAGE (NDP); SOFTWARE PROGRAMS;

AUTOMATIC TESTING; ELECTRONIC EQUIPMENT; EQUIPMENT TESTING; LIFE CYCLE; MAINTENANCE; MILITARY OPERATIONS; OPERATIONS RESEARCH; SIMULATORS; SUPPORTS; SYSTEMS ENGINEERING;

BUILT-IN SELF TEST;

EID: 3943048640     PISSN: 08858985     EISSN: None     Source Type: Journal    
DOI: 10.1109/MAES.2004.1346885     Document Type: Article

References (2)

1. Simpson, W. and Sheppard, J., 1994, System Test and Diagnosis, Boston, MA: Kluwer Academic Publishers.
2. IEEE Std 1232-1995, IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE): Overview and Architecture, Piscataway, NJ: IEEE Standards Press.