Evaluation technique for reliability in low-temperature poly-Si thin film transistors

Journal of the Korean Physical Society

Volumn 48, Issue SUPPL. 1, 2006, Pages

  Uraoka, Y ^a   Yano, H ^a   Hatayama, T ^a   Fuyuki, T ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

Degradation; Hot carrier; Low temperature poly Si; Reliability; TFT

Indexed keywords

EID: 33644507712     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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