Interfacial chemistry and the performance of bromine-etched CdZnTe radiation detector devices

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 4, 2002, Pages 2005-2009

  Rouse, A A ^a   Szeles, Csaba ^a   Ndap, J O ^a   Soldner, S A ^a   Parnham, K B ^a   Gaspar, D J ^b   Engelhard, M H ^b   Lea, A S ^b   Shutthanandan, S V ^b   Thevuthasan, T S ^b   Baer, D R ^b  

^a II VI Inc   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

Bromine; CdZnTe; Oxides; Pt; TeO2

Indexed keywords

BROMINE; COMPOSITION; DIFFUSION; ELECTRODES; ETCHING; OXIDATION; POSITIVE IONS; SEMICONDUCTING CADMIUM COMPOUNDS; SPUTTER DEPOSITION; STOICHIOMETRY; SURFACE CHEMISTRY; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRICAL PERFORMANCES;

RADIATION DETECTORS;

EID: 0036703141     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.801705     Document Type: Article

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