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Volumn 3446, Issue , 1998, Pages 2-9
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Growth and properties of semi-insulating CdZnTe for radiation detector applications
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Author keywords
Bridgman technique; CdZnTe; Nuclear radiation detectors
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Indexed keywords
CRACK PROPAGATION;
CRYSTAL GROWTH;
CRYSTAL MICROSTRUCTURE;
ELECTRIC CONDUCTIVITY MEASUREMENT;
ELECTRIC INSULATING MATERIALS;
ELECTRON TRAPS;
GRAIN BOUNDARIES;
GRAIN SIZE AND SHAPE;
INCLUSIONS;
INGOTS;
MORPHOLOGY;
RADIATION DETECTORS;
BRIDGMAN GROWTH;
CADMIUM ZINC TELLURIUM;
INFRARED MICROGRAPH;
MACROSCOPIC CRACKS;
NUCLEAR RADIATION DETECTOR;
PRECIPITATES;
SEMICONDUCTING CADMIUM COMPOUNDS;
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EID: 0032404459
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.312878 Document Type: Conference Paper |
Times cited : (46)
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References (13)
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