Electron trapping nonuniformity in high-pressure-Bridgman-grown CdZnTe

Journal of Applied Physics

Volumn 92, Issue 6, 2002, Pages 3198-3206

  Amman, Mark ^a   Lee, Julie S ^a   Luke, Paul N ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA SOURCES; CADMIUM ZINC TELLURIDES; CDZNTE CRYSTALS; COPLANAR GRIDS; DETECTION TECHNIQUE; DETECTOR RESPONSE; DETECTOR TECHNOLOGY; EFFECTIVE TOOL; EFFICIENT DETECTION; ELECTRON GENERATION; ELECTRON TRAPPING; ENERGY RESOLUTIONS; GAMMA RAY DETECTOR; GAMMA-RAY SPECTROSCOPY; INDUCED CHARGES; NONUNIFORM; NONUNIFORMITY; PLANAR DETECTORS; RECENT PROGRESS; ROOM TEMPERATURE; SCIENCE AND TECHNOLOGY; SMALL VARIATIONS; TWO-DIMENSIONAL MAP;

CADMIUM ALLOYS; CADMIUM COMPOUNDS; ELECTRON TRAPS; ENERGY EFFICIENCY; GAMMA RAYS; MATERIALS; TELLURIUM; TELLURIUM COMPOUNDS;

DETECTORS;

EID: 18644381735     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1502922     Document Type: Article

References (30)

1. Semiconductors for Room Temperature Nuclear Detector Applications, edited by T. E. Schlesinger and R. B. James, Semiconductors and Semimetals Vol. 43 (Academic, New York, 1995), and references therein.
2. Y. Eisen and A. Shor, J. Cryst. Growth 184/185, 1302 (1998), and references therein. jcr JCRGAE 0022-0248
3. T. E. Schlesinger, J. E. Toney, H. Yoon, E. Y. Lee, B. A. Brunett, L. Franks, and R. B. James, Mater. Sci. Eng. 32, 103 (2001), and references therein. mse MSCEAA 0025-5416
4. P. N. Luke, Appl. Phys. Lett. 65, 2884 (1994). apl APPLAB 0003-6951
5. P. N. Luke, IEEE Trans. Nucl. Sci. 42, 207 (1995). ien IETNAE 0018-9499
6. H. H. Barrett, J. D. Eskin, and H. B. Barber, Phys. Rev. Lett. 75, 156 (1995). prl PRLTAO 0031-9007
7. Z. He, G. F. Knoll, D. K. Wehe, R. Rojeski, C. H. Mastrangelo, M. Hammig, C. Barrett, and A. Uritani, Nucl. Instrum. Methods Phys. Res. A 380, 228 (1996). nia NIMAER 0168-9002
8. M. Amman and P. N. Luke, Proc. SPIE 3115, 205 (1997). spi PSISDG 0277-786X
9. Z. He, G. F. Knoll, D. K. Wehe, and J. Miyamoto, Nucl. Instrum. Methods Phys. Res. A 388, 180 (1997). nia NIMAER 0168-9002
10. D. S. McGregor, Z. He, H. A. Seifert, D. K. Wehe, and R. A. Rojeski, Appl. Phys. Lett. 72, 792 (1998). apl APPLAB 0003-6951
11. Z. He, W. Li, G. F. Knoll, D. K. Wehe, J. Berry, and C. M. Stahle, Nucl. Instrum. Methods Phys. Res. A 422, 173 (1999). nia NIMAER 0168-9002
12. M. Mayer, L. A. Hamel, O. Tousignant, J. R. Macri, J. M. Ryan, M. L. McConnell, V. T. Jordanov, J. F. Butler, and C. L. Lingren, Nucl. Instrum. Methods Phys. Res. A 422, 190 (1999). nia NIMAER 0168-9002
13. P. N. Luke, M. Amman, J. S. Lee, and H. Yaver, Nucl. Instrum. Methods Phys. Res. A 439, 611 (2000). nia NIMAER 0168-9002
14. C. Szeles and M. C. Driver, Proc. SPIE 3446, 2 (1998). spi PSISDG 0277-786X
15. P. N. Luke, M. Amman, T. H. Prettyman, P. A. Russo, and D. A. Close, IEEE Trans. Nucl. Sci. 44, 713 (1997). ien IETNAE 0018-9499
16. M. Amman and P. N. Luke, IEEE Trans. Nucl. Sci. 46, 205 (1999). ien IETNAE 0018-9499
17. T. H. Prettyman, M. K. Smith, and S. E. Soldner, Proc. SPIE 3768, 339 (1999). spi PSISDG 0277-786X
18. P. N. Luke, M. Amman, J. S. Lee, B. A. Ludewigt, and H. Yaver, Nucl. Instrum. Methods Phys. Res. A 458, 319 (2001). nia NIMAER 0168-9002
19. P. N. Luke and E. E. Eissler, IEEE Trans. Nucl. Sci. 43, 1481 (1996). ien IETNAE 0018-9499
20. F. P. Doty, J. P. Cozzatti, and J. P. Schomer, Proc. SPIE 3115, 51 (1997). spi PSISDG 0277-786X
21. B. H. Parker, C. M. Stahle, S. D. Barthelmy, A. M. Parsons, J. Tueller, J. T. Van Sant, B. F. Munoz, S. J. Snodgrass, and R. E. Mullinix, Proc. SPIE 3768, 129 (1999). spi PSISDG 0277-786X
22. M. Amman, J. S. Lee, and P. N. Luke, Proc. SPIE 3446, 179 (1998). spi PSISDG 0277-786X
23. M. Amman, P. N. Luke, and J. S. Lee, IEEE Trans. Nucl. Sci. 47, 760 (2000). ien IETNAE 0018-9499
24. M. Amman, J. S. Lee, and P. N. Luke, Proc. SPIE 4507, 1 (2001). spi PSISDG 0277-786X
25. C. Szeles, W. C. Chalmers, S. E. Cameron, J. Ndap, M. Bliss, and K. G. Lynn, Proc. SPIE 4507, 57 (2001). spi PSISDG 0277-786X
26. eV Products, a division of II-VI, Inc., Saxonburg, PA 16056.
27. SRIM program described in J. F. Ziegler, J. P. Biersack, and U. Littmark, The Stopping and Range of Ions in Solids (Pergamon, New York, 1985).
28. K. Hecht, Z. Phys. 77, 235 (1932). zep ZEPYAA 0044-3328
29. Imarad Imaging Systems Ltd., Rehovot, Israel.
30. R. B. James, B. Brunett, J. Heffelfinger, J. Van Scyoc, J. Lund, F. P. Doty, C. L. Lingren, R. Olsen, E. Cross, H. Hermon, H. Yoon, N. Hilton, M. Schieber, E. Y. Lee, J. Toney, T. E. Schlesinger, M. Goorsky, W. Yao, H. Chen, and A. Burger, J. Electron. Mater. 27, 788 (1998). jem JECMA5 0361-5235