메뉴 건너뛰기




Volumn 15, Issue 1, 2006, Pages 120-130

Piezo-FET stress-sensor arrays for wire-bonding characterization

Author keywords

Ball wedge bonding; In situ process monitoring; Piezo field transistors (FET); Stress sensor; Stress sensor array; Wire bonding

Indexed keywords

BONDING; CMOS INTEGRATED CIRCUITS; HALL EFFECT; IN SITU PROCESSING; PIEZOELECTRIC DEVICES; SEMICONDUCTOR DEVICE MANUFACTURE; SHEAR STRESS; STRESS CONCENTRATION;

EID: 32244433946     PISSN: 10577157     EISSN: None     Source Type: Journal    
DOI: 10.1109/JMEMS.2005.863702     Document Type: Article
Times cited : (50)

References (41)
  • 1
    • 0002647466 scopus 로고    scopus 로고
    • "Silicon piezoresistive stress sensors their application in electronic packaging"
    • J. C. Suhling and R. C. Jaeger, "Silicon piezoresistive stress sensors and their application in electronic packaging," IEEE Sensors J., vol. 1, pp. 14-30, 2001.
    • (2001) IEEE Sensors J. , vol.1 , pp. 14-30
    • Suhling, J.C.1    Jaeger, R.C.2
  • 2
    • 3042696929 scopus 로고    scopus 로고
    • "Two-dimensional high density piezo-FET stress sensor arrays for in-situ monitoring of wire bonding processes"
    • Maastricht The Netherlands
    • M. Doelle, C. Peters, P. Gieschke, P. Ruther, and O. Paul, "Two-dimensional high density piezo-FET stress sensor arrays for in-situ monitoring of wire bonding processes," in Proc. Tech. Digest IEEE MEMS 2004, Maastricht, The Netherlands, 2004, pp. 829-832.
    • (2004) Proc. Tech. Digest IEEE MEMS 2004 , pp. 829-832
    • Doelle, M.1    Peters, C.2    Gieschke, P.3    Ruther, P.4    Paul, O.5
  • 3
    • 0011931446 scopus 로고    scopus 로고
    • "Analysis of ultrasonic wire bonding by in-situ piezoresistive microsensors"
    • Munich Germany
    • J. Schwizer, M. Mayer, O. Brand, and H. Baltes, "Analysis of ultrasonic wire bonding by in-situ piezoresistive microsensors," in Proc. Digest Tech. Papers Transducers '01, Munich, Germany, 2001, pp. 1426-1429.
    • (2001) Proc. Digest Tech. Papers Transducers '01 , pp. 1426-1429
    • Schwizer, J.1    Mayer, M.2    Brand, O.3    Baltes, H.4
  • 6
    • 0003503829 scopus 로고    scopus 로고
    • "Microelectronic Bonding Process Monitoring by Integrated Sensors"
    • Ph.D. dissertation ETH Zurich
    • M. Mayer, "Microelectronic Bonding Process Monitoring by Integrated Sensors," Ph.D. dissertation, ETH Zurich, 2000.
    • (2000)
    • Mayer, M.1
  • 7
    • 32244437581 scopus 로고    scopus 로고
    • "CMOS Force Sensors for Wire Bonding Flip Chip Process Characterization"
    • Ph.D. dissertation ETH Zurich
    • J. Schwizer, "CMOS Force Sensors for Wire Bonding and Flip Chip Process Characterization," Ph.D. dissertation, ETH Zurich, 2003.
    • (2003)
    • Schwizer, J.1
  • 8
    • 0033701561 scopus 로고    scopus 로고
    • "Integrated temperature microsensors for characterization optimization of thermosonic ball bonding process"
    • M. Mayer, O. Paul, D. Bolliger, and H. Baltes, "Integrated temperature microsensors for characterization and optimization of thermosonic ball bonding process," IEEE Trans. Comp. Packag. Technol., vol. 23, no. 2, pp. 393-398, 2000.
    • (2000) IEEE Trans. Comp. Packag. Technol. , vol.23 , Issue.2 , pp. 393-398
    • Mayer, M.1    Paul, O.2    Bolliger, D.3    Baltes, H.4
  • 10
    • 0035768411 scopus 로고    scopus 로고
    • "In-Situ ultrasonic stress microsensor for second bond characterization"
    • J. Schwizer, M. Mayer, O. Brand, and H. Baltes, "In-Situ ultrasonic stress microsensor for second bond characterization," in Proc. Int. Sym. Microelectr. IMAPS 2001, pp. 338-343.
    • (2001) Int. Sym. Microelectr. IMAPS , pp. 338-343
    • Schwizer, J.1    Mayer, M.2    Brand, O.3    Baltes, H.4
  • 11
  • 12
    • 0032230717 scopus 로고    scopus 로고
    • "In-Situ calibration of wire bonder ultrasonic system using integrated microsensor"
    • Singapore
    • M. Mayer, O. Paul, D. Bolliger, and H. Baltes, "In-Situ calibration of wire bonder ultrasonic system using integrated microsensor," in Proc. EPTC 98, Singapore, 1998, pp. 219-223.
    • (1998) EPTC 98 , pp. 219-223
    • Mayer, M.1    Paul, O.2    Bolliger, D.3    Baltes, H.4
  • 13
    • 0001612819 scopus 로고    scopus 로고
    • "In-situ measurement of stress temperature under bonding pads during wire bonding using integrated microsensors"
    • Bangalore India
    • M. Mayer, O. Paul, and H. Baltes, "In-situ measurement of stress and temperature under bonding pads during wire bonding using integrated microsensors," in Proc. EMIT '98, Bangalore, India, 1998, pp. 129-133.
    • (1998) Proc. EMIT '98 , pp. 129-133
    • Mayer, M.1    Paul, O.2    Baltes, H.3
  • 14
    • 32244441110 scopus 로고
    • "Piezo-FET analogue transducers"
    • G. Nuzillat and H. Helioui, "Piezo-FET analogue transducers," Revue Technique Thomson-Csf, vol. 5, no. 1, pp. 49-80, 1973.
    • (1973) Revue Technique Thomson-Csf , vol.5 , Issue.1 , pp. 49-80
    • Nuzillat, G.1    Helioui, H.2
  • 15
    • 0037438921 scopus 로고    scopus 로고
    • "Electromagnetic actuation mos-transistor sensing for CMOS-integrated micromechanical resonators"
    • D. Lange, C. Hagleitner, C. Herzog, O. Brand, and H. Baltes, "Electromagnetic actuation and mos-transistor sensing for CMOS-integrated micromechanical resonators," Sens. Actuators A, Phys., vol. 103, no. 1-2, pp. 150-155, 2003.
    • (2003) Sens. Actuators A Phys. , vol.103 , Issue.1-2 , pp. 150-155
    • Lange, D.1    Hagleitner, C.2    Herzog, C.3    Brand, O.4    Baltes, H.5
  • 16
    • 0037480236 scopus 로고    scopus 로고
    • "A novel stress sensor based on the transverse pseudo-Hall effect of MOSFETs"
    • M. Doelle, P. Ruther, and O. Paul, "A novel stress sensor based on the transverse pseudo-Hall effect of MOSFETs," in Proc. IEEE MEMS 2003, 2003, pp. 490-493.
    • (2003) Proc. IEEE MEMS 2003 , pp. 490-493
    • Doelle, M.1    Ruther, P.2    Paul, O.3
  • 17
    • 3042802676 scopus 로고    scopus 로고
    • "Shear stress sensitive piezo-FET stress sensors with offset reduction of nonmechanical contributions"
    • Guimaraes Portugal
    • M. Doelle, P. Ruther, and O. Paul, "Shear stress sensitive piezo-FET stress sensors with offset reduction of nonmechanical contributions," in Proc. CD-ROM Eurosensors XVII, Guimaraes, Portugal, 2003.
    • (2003) Proc. CD-ROM Eurosensors XVII
    • Doelle, M.1    Ruther, P.2    Paul, O.3
  • 19
    • 0035445467 scopus 로고    scopus 로고
    • "Piezoresistive characteristics of short-channel MOSFET's on (100) silicon"
    • A. T. Bradley, R. C. Jaeger, J. C. Suhling, and K. J. O'Connor, "Piezoresistive characteristics of short-channel MOSFET's on (100) silicon," IEEE Trans. Electron Devices, vol. 48, pp. 2009-2015, 2001.
    • (2001) IEEE Trans. Electron Devices , vol.48 , pp. 2009-2015
    • Bradley, A.T.1    Jaeger, R.C.2    Suhling, J.C.3    O'Connor, K.J.4
  • 20
    • 0004247893 scopus 로고
    • Delft The Netherlands: Delft University Press
    • S. Middelhoek and S. A. Audet, Silicon Sensors. Delft, The Netherlands: Delft University Press, 1994.
    • (1994) Silicon Sensors
    • Middelhoek, S.1    Audet, S.A.2
  • 21
    • 34249846476 scopus 로고
    • "Semiconducting stress transducers utilizing transverse shear piezoresistance effects"
    • W. G. Pfann and R. N. Thurston, "Semiconducting stress transducers utilizing transverse and shear piezoresistance effects," J. Appl. Phys., vol. 32, no. 10, pp. 2008-2019, 1961.
    • (1961) J. Appl. Phys. , vol.32 , Issue.10 , pp. 2008-2019
    • Pfann, W.G.1    Thurston, R.N.2
  • 22
    • 0016962756 scopus 로고
    • "Effect of mechanical-stress on offset voltages of hall devices in Si Ic"
    • Y. Kanda and M. Migitaka, "Effect of mechanical-stress on offset voltages of hall devices in Si Ic," Phys. Stat. Sol. A, vol. 35, no. 2, pp. K115-K118, 1976.
    • (1976) Phys. Stat. Sol. A , vol.35 , Issue.2
    • Kanda, Y.1    Migitaka, M.2
  • 23
    • 0019586319 scopus 로고
    • "Hall-Effect devices as strain pressure sensors"
    • Y. Kanda and A. Yasukawa, "Hall-Effect devices as strain and pressure sensors," Sens. Actuators, vol. 2, no. 3, pp. 283-296, 1982.
    • (1982) Sens. Actuators , vol.2 , Issue.3 , pp. 283-296
    • Kanda, Y.1    Yasukawa, A.2
  • 24
    • 0033183819 scopus 로고    scopus 로고
    • "Pseudo-Hall effect anisotropic magnetoresistance in a micronscale Ni80Fe20 device"
    • C. C. Yao, D. G. Hasko, W. Y. Lee, A. Hirohata, Y. B. Xu, and J. A. C. Bland, "Pseudo-Hall effect and anisotropic magnetoresistance in a micronscale Ni80Fe20 device," IEEE Trans. Magn., vol. 35, pp. 3616-3618, 1999.
    • (1999) IEEE Trans. Magn. , vol.35 , pp. 3616-3618
    • Yao, C.C.1    Hasko, D.G.2    Lee, W.Y.3    Hirohata, A.4    Xu, Y.B.5    Bland, J.A.C.6
  • 27
    • 9744271881 scopus 로고
    • "Stress inter-sub-band correlation in silicon inversion layer"
    • I. Eisele, "Stress and inter-sub-band correlation in silicon inversion layer," Surface Sci., vol. 73, no. 1, pp. 315-337, 1978.
    • (1978) Surface Sci. , vol.73 , Issue.1 , pp. 315-337
    • Eisele, I.1
  • 28
    • 0019545856 scopus 로고
    • "Stress-Sensitive properties of silicon-gate MOS devices"
    • H. Mikoshiba, "Stress-Sensitive properties of silicon-gate MOS devices," Solid-State Electron., vol. 24, no. 3, pp. 221-232, 1981.
    • (1981) Solid-State Electron. , vol.24 , Issue.3 , pp. 221-232
    • Mikoshiba, H.1
  • 29
    • 4243892466 scopus 로고
    • "Many-Valley interactions in N-type silicon inversion layers"
    • G. Dorda, I. Eisele, and H. Gesch, "Many-Valley interactions in N-type silicon inversion layers," Phys. Rev. B, vol. 17, no. 4, pp. 1785-1798, 1978.
    • (1978) Phys. Rev. B , vol.17 , Issue.4 , pp. 1785-1798
    • Dorda, G.1    Eisele, I.2    Gesch, H.3
  • 30
    • 33846693940 scopus 로고
    • "Piezoresistance effect in Germanium Silicon"
    • C. S. Smith, "Piezoresistance effect in Germanium and Silicon," Phys. Rev., vol. 94, no. 1, pp. 42-49, 1954.
    • (1954) Phys. Rev. , vol.94 , Issue.1 , pp. 42-49
    • Smith, C.S.1
  • 31
    • 1242331610 scopus 로고    scopus 로고
    • "The piezojunction effect in silicon sensors circuits its relation to piezoresistance"
    • J. F. Creemer, F. Fruett, G. C. M. Meijer, and P. J. French, "The piezojunction effect in silicon sensors and circuits and its relation to piezoresistance," IEEE Sensors J., vol. 1, pp. 98-108, 2001.
    • (2001) IEEE Sensors J. , vol.1 , pp. 98-108
    • Creemer, J.F.1    Fruett, F.2    Meijer, G.C.M.3    French, P.J.4
  • 32
    • 0003444320 scopus 로고    scopus 로고
    • "Piezoresistive Behavior of MOSFET's MOS Circuits"
    • Ph.D. dissertation Auburn University
    • A. T. Bradley, "Piezoresistive Behavior of MOSFET's and MOS Circuits," Ph.D. dissertation, Auburn University, 1999.
    • (1999)
    • Bradley, A.T.1
  • 33
    • 0026219178 scopus 로고
    • "Piezoresistive stress sensors for structural analysis of electronic packages"
    • D. A. Bittle, J. C. Suhling, R. E. Beaty, R. C. Jaeger, and R.W. Johnson, "Piezoresistive stress sensors for structural analysis of electronic packages," J. Electron. Packag., vol. 113, pp. 203-215, 1991.
    • (1991) J. Electron. Packag. , vol.113 , pp. 203-215
    • Bittle, D.A.1    Suhling, J.C.2    Beaty, R.E.3    Jaeger, R.C.4    Johnson, R.W.5
  • 34
    • 26844561670 scopus 로고    scopus 로고
    • "Geometry dependent sensitivity of planar piezoresistive stress sensors based on the pseudo-hall effect"
    • Miami FL
    • M. Doelle, D. Mager, P. Ruther, and O. Paul, "Geometry dependent sensitivity of planar piezoresistive stress sensors based on the pseudo-hall effect," in Proc. Tech. Digest IEEE MEMS 2005, Miami, FL, 2005, pp. 267-270.
    • (2005) Proc. Tech. Digest IEEE MEMS 2005 , pp. 267-270
    • Doelle, M.1    Mager, D.2    Ruther, P.3    Paul, O.4
  • 36
    • 36849104521 scopus 로고
    • "Calculated elastic-constants for stress problems associated with semiconductor devices"
    • W. A. Brantley, "Calculated elastic-constants for stress problems associated with semiconductor devices," J. Appl. Phys., vol. 44, no. 1, pp. 534-535, 1973.
    • (1973) J. Appl. Phys. , vol.44 , Issue.1 , pp. 534-535
    • Brantley, W.A.1
  • 37
    • 3042784575 scopus 로고    scopus 로고
    • "Silicon smart tactile image sensor with pneumatically swollen single diaphragm structure"
    • Maastricht The Netherlands
    • H. Takao, K. Sawada, and M. Ishida, "Silicon smart tactile image sensor with pneumatically swollen single diaphragm structure," in Proc. Tech. Digest IEEE MEMS 2004, Maastricht, The Netherlands, 2004, pp. 846-849.
    • (2004) Proc. Tech. Digest IEEE MEMS 2004 , pp. 846-849
    • Takao, H.1    Sawada, K.2    Ishida, M.3
  • 38
    • 0034467107 scopus 로고    scopus 로고
    • "A traction stress sensor array for use in high-resolution robotic tactile imaging"
    • B. J. Kane, M. R. Cutkosky, and G. T. A. Kovacs, "A traction stress sensor array for use in high-resolution robotic tactile imaging," J. Microelectromech. Syst., vol. 9, pp. 425-434, 2000.
    • (2000) J. Microelectromech. Syst. , vol.9 , pp. 425-434
    • Kane, B.J.1    Cutkosky, M.R.2    Kovacs, G.T.A.3
  • 39
    • 0032053914 scopus 로고    scopus 로고
    • "Mechanical imaging: A new technology for medical diagnostics"
    • A. Sarvazyan, "Mechanical imaging: A new technology for medical diagnostics," J. Med. Inform., vol. 49, no. 2, pp. 195-216, 1998.
    • (1998) J. Med. Inform. , vol.49 , Issue.2 , pp. 195-216
    • Sarvazyan, A.1
  • 40
    • 0025699037 scopus 로고
    • "Tactile image detection using a 1K-Element silicon pressure sensor array"
    • S. Sugiyama, K. Kawahata, M. Yoneda, and I. Igarashi, "Tactile image detection using a 1K-Element silicon pressure sensor array," Sens. Actuators A, Phys., vol. 22, no. 1-3, pp. 397-400, 1990.
    • (1990) Sens. Actuators A Phys. , vol.22 , Issue.1-3 , pp. 397-400
    • Sugiyama, S.1    Kawahata, K.2    Yoneda, M.3    Igarashi, I.4
  • 41
    • 0033888145 scopus 로고    scopus 로고
    • "A flexible micromachine-based shear-stress sensor array its application to separation-point detection"
    • F. K. Jiang, G. B. Lee, Y. C. Tai, and C. M. Ho, "A flexible micromachine-based shear-stress sensor array and its application to separation-point detection," Sens. Actuators A, Phys., vol. 79, no. 3, pp. 194-203, 2000.
    • (2000) Sens. Actuators A Phys. , vol.79 , Issue.3 , pp. 194-203
    • Jiang, F.K.1    Lee, G.B.2    Tai, Y.C.3    Ho, C.M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.