Changing the scan enable during shift

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2004, Pages 73-78

  Sitchinava, Nodari ^a   Samaranayake, Samitha ^b   Kapur, Rohit ^a   Gizdarski, Emil ^a   Neuveux, Fredric ^a   Williams, T W ^a  

^a SYNOPSYS INC   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA SIGNALS; SCAN CHAINS; TEST APPLICATION TIME (TAT); TEST DATA VOLUME (TDV);

BENCHMARKING; BITS; DATA ACQUISITION; DESIGN FOR TESTABILITY; NETWORKS (CIRCUITS); OPTIMIZATION; PATTERN RECOGNITION; SHIFT REGISTERS; SIGNAL PROCESSING;

SCANNING;

EID: 3142711739     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2004.1299228     Document Type: Conference Paper

References (11)

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