Test point insertion that facilitates ATPG in reducing test time and data volume

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 138-147

  Geuzebroek, M J ^a   Van Der Linden, J Th ^b   Van De Goor, A J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b Scientificial   (Netherlands)

Author keywords

ATPG; Compact test sets; Fault coverage; Gate delay faults; Stuck at faults; Test length; Test point insertion

Indexed keywords

ALGORITHMS; DATA REDUCTION; FUNCTIONS; NETWORKS (CIRCUITS);

AUTOMATIC TEST EQUIPMENT; AUTOMATIC TEST PATTERN GENERATORS; COST FUNCTION; FAULT COVERAGE; GATE-DELAY FAULTS; TEST LENGTH; TEST POINT INSERTION; TEST POINTS; TEST SETS; TESTABILITY ANALYSIS;

AUTOMATIC TESTING;

EID: 0036443212     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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