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Materials Research Society Symposium Proceedings

Volumn 875, Issue , 2005, Pages 63-68

Investigation of the deformation behavior in nanoindented metal/nitride multilayers by coupling FIB-TEM and AFM observations

(4) Abadias, G a Tromas, C a Tse, Y Y a Michel, A a

a UMR 6630 (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; NITRIDES; PLASTIC FLOW; SHEAR DEFORMATION; TRANSMISSION ELECTRON MICROSCOPY;

DEFORMATION BEHAVIOR; DEFORMATION MODES; ION BEAM SPUTTERING;

MULTILAYERS;

EID: 30644478690 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (2)

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