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Scripta Materialia

Volumn 50, Issue 6, 2004, Pages 745-749

Novel method for TEM characterization of deformation under nanoindents in nanolayered materials

(4) Kramer, D E a,b Savage, M F a,c Lin, A a,d Foecke, T a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

b Northwestern University (United States)

c PRATT AND WHITNEY (United States)

d University of Illinois at Urbana Champaign (United States)

Author keywords

Dislocations; Multilayer; Nanoindentation; Nanolaminate; TEM

Indexed keywords

CRYSTAL LATTICES; DISLOCATIONS (CRYSTALS); HARDNESS; MICROSTRUCTURE; NIOBIUM COMPOUNDS; NITRIDES; PLASTIC DEFORMATION; SINGLE CRYSTALS; STACKING FAULTS; TENSILE STRENGTH; TENSILE TESTING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN;

NANOINDENTATION; NANOLAMINATES;

NANOSTRUCTURED MATERIALS;

EID: 0347759951 PISSN: 13596462 EISSN: None Source Type: Journal
DOI: 10.1016/j.scriptamat.2003.11.043 Document Type: Article

Times cited : (19)

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