Novel in situ and real-time optical probes to detect (surface) defect states of a-Si:H

Materials Research Society Symposium Proceedings

Volumn 862, Issue , 2005, Pages 19-30

  Kessels, W M M ^a   Aarts, I M P ^a   Gielis, J J H ^a   Hoefnagels, J P M ^a   Van De Sanden, M C M ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; ERBIUM; SECOND HARMONIC GENERATION; THIN FILMS;

CAVITY RINGDOWN SPECTROSCOPY (CRDS); PHOTON ENERGY; SUBGAP ENERGIES;

AMORPHOUS SILICON;

EID: 30644472790     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-862-a14.3     Document Type: Conference Paper

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