SCOPUS 정보 검색 플랫폼

Volumn 338-340, Issue 1 SPEC. ISS., 2004, Pages 408-411

Analysis of a-Si:H subgap absorption spectra obtained from absolute cavity ringdown absorption spectroscopy using an empirical DOS model

(3) Aarts, I M P a Van de Sanden, M C M a Kessels, W M M a

a EINDHOVEN UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ATMOSPHERIC SPECTRA; CARRIER COMMUNICATION; DENSITY (OPTICAL); DEPOSITION; MAGNETIC FIELD EFFECTS; PHOTONIC PROPULSION; PLASMAS; REFLECTION; SPECTROSCOPIC ANALYSIS; SURFACE ROUGHNESS; THIN FILMS;

DECONVOLUTION PROCESS; OPTICAL PARAMETERS; PARABOLIC DISTRIBUTIONS; PHOTOTHERMAL DEFLECTION SPECTROSCOPY (PDS); SIMULATED ABSORPTION SPECTRUM;

AMORPHOUS SILICON;

EID: 2942556901 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2004.03.100 Document Type: Conference Paper

Times cited : (5)

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