Direct measurement of tapping force with a cantilever deflection force sensor

Ultramicroscopy

Volumn 100, Issue 3-4, 2004, Pages 233-239

  Su, Chanmin ^a   Huang, Lin ^a   Kjoller, Kevin ^a  

^a VEECO INSTRUMENTS INC   (United States)

Author keywords

07.79. v; 07.79.Lh; 68.37.Ps; Atomic force; Intermittent contact; Tapping; Tip surface interaction

Indexed keywords

ACOUSTIC NOISE; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; SENSORS;

DEFLECTION FORCE SENSORS; DEFLECTION SENSITIVITY; TAPPING FORCES;

FORCE MEASUREMENT;

AMPLITUDE MODULATION; ATOMIC FORCE MICROSCOPY; CALIBRATION; CONFERENCE PAPER; IMAGING; QUANTITATIVE ANALYSIS; SENSOR; STANDARDIZATION;

EID: 3042568781     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2003.11.007     Document Type: Conference Paper

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